Dr. Cher Ming Tan is a Singaporean, and he received his Ph.D in Electrical Engineering from the University of Toronto in 1992. He has 10 years of working experiences in reliability in electronic industry before joining Nanyang Technological University (NTU), Singapore as faculty member in 1996 till 2014. He joined Chang Gung University, Taiwan and set up a research Center on Reliability Sciences and Technologies in Taiwan and acts as Center Director. He is Professor in Electronic Department of Chang Gung University, Honorary Chair Professor in Ming Chi University of Technology, Taiwan, Adjunct Professor in the College of Medicine, and Researcher in the Chang Gung Memorial Hospital, Linkou. He has published 400+ International Journal and Conference papers, and giving 10+ keynote talks and 60+ invited talks in International Conferences and several tutorials in International Conferences. He holds 14 patents and 1 copyright on reliability software. He has written 5 books and 4 book chapters in the field of reliability. He is an Editor of Scientific Report, Nature Publishing Group, an Editor of IEEE Transaction on Materials and Devices Reliability, Series Editor of SpringerBrief in Reliability, and Associate editor of Microelectronic Reliability. He is a member of the advisory panel of Elsevier Publishing Group.
He is a past chair of IEEE Singapore Section in 2006, senior member of IEEE and ASQ, Distinguish Lecturer of IEEE Electronic Device Society on reliability, Founding Chair and current Chair of IEEE Nanotechnology Chapter – Singapore Section, Fellow of Institute of Engineers, Singapore, and Fellow of Singapore Quality Institute. He is the Founding Chair of IEEE International Conference on Nanoelectronics, General Chair of ANQ Congress 2014. He is a recipient of IEEE Region 10 Outstanding Volunteer Award in 2011. He was Guest Editor of International J. of Nanotechnology, Nano-research letter and Microelectronic Reliability. He is in the reviewer board of several International Journals such as Thin Solid Film, Microelectronic Reliability, various IEEE Transactions, Reliability Engineering and System Safety etc. He is the first individual recipient of Ishikawa-Kano Quality Award in Singapore in 2014. He is active in providing consultation to multi-national corporations on reliability. He is also in the working group committee of IEEE reliability standards 1413 and IEEE 1624. He is in the IEEE EDS Reliability Physics committee.
His research interests include reliability and failure physics modeling of electronic components and systems, finite element modeling of materials degradation, statistical modeling of engineering systems, nano-materials and devices reliability, and prognosis & health management of engineering system.