Cher Ming Tan is a Professor in Chang Gung University, Taiwan. He has 34 (until 2018) years of experience in reliability field, including 2 years of experience dealing with US Military electronic products reliability testing. He spent 10 years in industrial leading the quality and reliability work in the various companies, and 18 years in Nanyang Technological University, Singapore researching new methodologies and phenomena of products reliability, including material, electronic and opto-electronic devices, energy storage devices and electronic systems reliability. He was a Principal Investigator of a TUM Create Project from Singapore National Research Foundation on Mega e-mobility, a joint project between Technical University of Munich and Nanyang Technological University.
He has 10 years of working experiences in reliability in electronic industry (both Singapore and Taiwan) before joining Nanyang Technological University (NTU) as faculty member in 1996 to 2014. He is now a Professor in Chang Gung University, Taiwan and Director of Centre of Reliability Science and Technology. He is also Honorable Chair Professor in Mingchi University. He has published more than 300 International Journal and Conference papers, and holding 10 patents and 1 copyright for reliability software.He has written 5 books and 4 book chapters in the field of reliability. He is also the Series Editor of Springer Brief in Reliability. He is also the Founding Chair of IEEE International Conference on Nanoelectronics, General Co-Chair of International Symposium of Integrated Circuits 2007 and 2009. He is also the recipient of IEEE Region 10 Outstanding Volunteer Award in 2011.