Dr. Cher Ming Tan
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Research Interest

Home Research Interest

Click here to watch the video- ``Journey of Reliability Science with CReST``

Journal Papers

  • Interconnect Reliability
  • Nanotechnology
  • Devices Reliability
  • Prognosis and Health Mgmt./ Predictive Maintenance
  • Wafer Bonding
  • Integrated Circuit Reliability
  • Failure Analysis
  • LED Reliability
  • Others

Conference Papers

  • Interconnect Reliability
  • Nanotechnology
  • Devices Reliability
  • Prognosis and Health Mgmt./ Predictive Maintenance
  • Wafer Bonding
  • Reliability Statistics
  • LED Reliability
  • Integrated Circuit Reliability
  • Failure Analysis
  • Quality
  • Others
 

S.No. Research Area  Journal Papers Conference Papers Total papers Invited Talks  Tutorials Keynote Speech
1 Interconnect Reliability* 46 45 91 9 2 1
2 Nanotechnology 20 20 40 2 0 1
3 Devices Reliability 15 11 26 0 0 0
4 Prognosis and Health Mgmt./ Predictive Maintenance 6 15 21 7 0 1
5 Wafer Bonding 7 12 19 2 0 0
6 Integrated Circuit Reliability 7 8 15 2 1 0
7 Failure Analysis 7 6 13 0 0 0
8 Reliability Statistics 3 9 12 5 0 1
9 LED Reliability 14 11 25 4 0 0
10 Quality 2 6 8 1 0 0
11 Battery 3 4 7 2 0 2
12 Remanufacturing 1 1 2 0 0 0
13 General Reliability 0 1 1 1 2 0
14 Others 11 18 29 8 0 0
TOTAL 142 167 309 43 5 6

*Interconnect includes ULSI Interconnects, TSV, Solders and wire bonding

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