Dr. Cher Ming Tan

Research Interest

Home Research Interest

Journal Papers

  • Interconnect Reliability
  • Nanotechnology
  • Devices Reliability
  • Prognosis and Health Mgmt./ Predictive Maintenance
  • Wafer Bonding
  • Integrated Circuit Reliability
  • Failure Analysis
  • LED Reliability
  • Quality
  • Battery
  • Electromagnetics
  • Others

Conference Papers

  • Interconnect Reliability
  • Nanotechnology
  • Devices Reliability
  • Prognosis and Health Mgmt./ Predictive Maintenance
  • Wafer Bonding
  • Reliability Statistics
  • LED Reliability
  • Integrated Circuit Reliability
  • Failure Analysis
  • Quality
  • Reliability Statistics
  • Battery
  • Quality
  • Electromagnetics
  • Others
No. Research Area # of Journal Papers # of Conference Papers Total # of papers # of Invited Talks # of Tutorials # of Keynote Speech
1 Interconnect Reliability* 46 45 91 13 2 3
2 Nanotechnology 22 22 44 2 1 2
3 Devices Reliability 16 11 27 5 1 2
4 Prognosis and Health Mgmt./ Predictive Maintenance 7 13 20 9 0 1
5 Wafer Bonding 7 12 19 1 0 0
6 Integrated Circuit Reliability 7 6 13 3 1 0
7 Failure Analysis 8 8 16 1 0 3
8 Reliability Statistics 3 9 12 6 0 1
9 LED Reliability 20 13 33 10 0 0
10 Quality 2 6 8 3 0 0
11 Battery 5 8 13 4 0 1
12 Remanufacturing 1 1 2 0 0 0
13 Electromagnetics 5 6 11 2 0 0
14 General Reliability 0 2 2 0 2 0
15 Others 13 22 35 7 0 0
TOTAL 162 184 346 66 7 13