3D simulation-based research on the effect of interconnect structures on circuit reliability

JOURNAL PAPERS

Physics of electromigration in today ULSI interconnections (Tutorial)

CONFERENCE PAPERS

3D electromigration modeling at circuit level (Invited Talk)

CONFERENCE PAPERS

Comparison of electromigration simulation in test structure and actual circuit

JOURNAL PAPERS

Reliability study of LED driver – a case study of black box testing

JOURNAL PAPERS

Reliability study of LED driver – a case study of black box testing

CONFERENCE PAPERS

Effect of IC layout on the reliability of CMOS amplifiers

JOURNAL PAPERS

Electromigration reliability of interconnections in RF low noise amplifier circuit

JOURNAL PAPERS

Effect of IC layout on the reliability of CMOS amplifiers

CONFERENCE PAPERS

Circuit level interconnect reliability study using 3D circuit model

JOURNAL PAPERS