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Dr. Cher Ming Tan

Professor, CGU, Director, CReST Center

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Dr. Cher Ming Tan

Professor, CGU, Director, CReST Center

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DR. CHER MING TAN
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CONTACT

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Integrated Circuit Reliability

Integrated Circuit Reliability

3D simulation-based research on the effect of interconnect structures on circuit reliability

Physics of electromigration in today ULSI interconnections (Tutorial)

CONFERENCE PAPERS

3D electromigration modeling at circuit level (Invited Talk)

CONFERENCE PAPERS

Comparison of electromigration simulation in test structure and actual circuit

Reliability study of LED driver – a case study of black box testing

Reliability study of LED driver – a case study of black box testing

CONFERENCE PAPERS

Effect of IC layout on the reliability of CMOS amplifiers

Electromigration reliability of interconnections in RF low noise amplifier circuit

Effect of IC layout on the reliability of CMOS amplifiers

CONFERENCE PAPERS

Circuit level interconnect reliability study using 3D circuit model

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Battery Devices Reliability Electromagnetics Failure Analysis General Reliability Integrated Circuit Reliability Interconnects Reliability LED Reliability Memory Nanotechnology Others Predictive Maintenance Predictive Maintenance/ Prognosis and Health Mgt Prognosis and Health Mgt Quality Quantitative Service Reliability Assessment on Single and Multi Layer Networks Radiation Reliability Statistics Remanufacturing Theory and Practice of Quality and Reliability Engineering in Asia Industry Wafer Bonding

Recent Posts

Effect of moisture content on the degradation of silicone used as an LED optical housing material- An ab initio study
Parametric performance analysis of battery operated electric vehicle
Degradation dynamics of quantum dots in white LED applications
Impact of visible light and humidity on the stability of high-power light emitting diode packaging material
Electronic Reliability Analysis under Radiation Environment

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