Statistical modeling of via redundancy effects on interconnect reliability

CONFERENCE PAPERS

Unveiling the electromigration physics of ULSI interconnects through statistics

JOURNAL PAPERS

Statistical analysis of multi-censored electromigration data using the EM algorithm

CONFERENCE PAPERS

An approach to statistical analysis of gate oxide breakdown mechanisms

CONFERENCE PAPERS

New analysis technique for time to failure data in copper electromigration

CONFERENCE PAPERS

Reliability improvement in Al metallization: a combination of statistical prediction and failure analytical methodology

JOURNAL PAPERS

Reliabiilty Analysis and Application with MATLAB (invited)

CONFERENCE PAPERS

Reliability Data Analysis

CONFERENCE PAPERS

A reliability statistics perspective on the pitfalls of standard wafer-level electromigration accelerated test (SWEAT)

JOURNAL PAPERS

Reliability data analysis software development

CONFERENCE PAPERS